Li, Hongliang, <pre><span>Microsystem</span> <span>&amp;</span> <span>Terahertz</span> Research Center, China Academy of Engineering Physics</pre>

• The 8th International Conference on Computational Methods (ICCM2017) - MS-000 General Papers
  3D Simulation of the Defect Generation by Hydrogen at $Si-SiO_2$ Interface
  Abstract  PDF